Ghinaya H, Herteno R, Faisal MR, Farmadi A, Indriani F. Analysis of Important Features in Software Defect Prediction Using Synthetic Minority Oversampling Techniques (SMOTE), Recursive Feature Elimination (RFE) and Random Forest. j.electron.electromedical.eng.med.inform [Internet]. 2024May27 [cited 2025Mar.18];6(3):276-88. Available from: https://jeeemi.org/index.php/jeeemi/article/view/453