[1]
Ghinaya, H., Herteno, R., Faisal, M.R., Farmadi, A. and Indriani, F. 2024. Analysis of Important Features in Software Defect Prediction Using Synthetic Minority Oversampling Techniques (SMOTE), Recursive Feature Elimination (RFE) and Random Forest. Journal of Electronics, Electromedical Engineering, and Medical Informatics. 6, 3 (May 2024), 276-288. DOI:https://doi.org/10.35882/jeeemi.v6i3.453.